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Hafnium Silicide Sputtering Targets

Hafnium Silicide Sputtering Targets

Hafnium Silicide Sputtering Targets
Product No NRE-43441
CAS No. 12401-56-8
Formula HfSi2
Molecular Weight 234.66
Purity >99.9%
Density 7.6 g/cm3
Thickness 3 mm ± 0.5mm (can be customized)
Diameter 50 mm ± 1mm (can be customized)
Shape Round
Resistivity NA
Thermal Conductivity NA

Hafnium Silicide Sputtering Targets

Introduction

Hafnium silicide (HfSi₂) sputtering targets are used in the deposition of hafnium silicide thin films through sputtering techniques. Hafnium silicide is known for its excellent thermal stability, high melting point, and significant electrical conductivity, making it an important material in semiconductor and microelectronic applications.

Applications

Semiconductor Interconnects:

HfSi₂ is utilized in the fabrication of interconnects in integrated circuits due to its low resistivity and ability to withstand high temperatures, which helps improve device performance.

Gate Electrode Materials:

In advanced transistor technology, hafnium silicide can serve as a gate electrode material, enhancing the electrical properties of transistors in nanoscale devices.

Barrier Layers:

HfSi₂ is effective as a barrier layer in metal contacts to prevent the diffusion of copper and other metals into the silicon substrate, thereby improving the reliability of electronic devices.

MEMS Devices:

Hafnium silicide thin films are used in microelectromechanical systems (MEMS) applications, where their mechanical and electrical properties contribute to the functionality of sensors and actuators.

Research and Development:

Hafnium silicide targets are valuable in material science research, facilitating the exploration of new properties and applications in thin film technologies.

 

 

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